
This paper studies the problem of Person Re-Identification (ReID)
for large-scale applications. Recent research efforts have been devoted
to building complicated part models, which introduce considerably
high computational cost and memory consumption, inhibiting its practicability
in large-scale applications. This paper aims to develop a novel learning
strategy to find efficient feature embeddings while maintaining the
balance of accuracy and model complexity. More specifically, we find
by enhancing the classical triplet loss together with cross-entropy
loss, our method can explore the hard examples and build a discriminant
feature embedding yet compact enough for large-scale applications.
Our method is carried out progressively using Bayesian optimization,
and we call it the Progressive Learning Algorithm (PLA). Extensive
experiments on three large-scale datasets show that our PLA is comparable
or better than the state-of-the-arts. Especially, on the challenging
Market-1501 dataset, we achieve Rank-1=94.7%/mAP=89.4% while saving
at least 30\% parameters than strong part models.

Local Clustering with Mean Teacher for Semi-supervised learning

The Mean Teacher (MT) model of Tarvainen and Valpola has shown favorable performance on several semi- supervised benchmark datasets. MT maintains a teacher model’s weights as the exponential moving average of a student model’s weights and minimizes the divergence between their probability predictions under diverse perturbations of the inputs. However, MT is known to suffer from confirmation bias, that is, reinforcing incorrect teacher model predictions. In this work, we propose a simple yet effective method called Local Clustering (LC) to mitigate the effect of confirmation bias. In MT, each data point is considered independent of other points during training; however, data points are likely to be close to each other in feature space if they share similar features. Motivated by this, we cluster data points locally by minimizing the pairwise distance between neighboring data points in feature space. Combined with a standard classification cross-entropy objective on labeled data points, the misclassified unlabeled data points are pulled towards high-density regions of their correct class with the help of their neighbors, thus improving model performance. We demonstrate on semi-supervised benchmark datasets SVHN and CIFAR-10 that adding our LC loss to MT yields significant improvements compared to MT and performance comparable to the state of the art in semi-supervised learning.

**Session Chairs**: prof. Yair Weiss, prof. Gian Luca Foresti

OS T1.3: Clustering for Pattern Analysis

technical paper

ICPR 2020 is the premier international conference on Pattern Recognition, gathering leading researchers from around the world to present their latest achievements in Pattern Analysis and Recognition, applied Artificial Intelligence and Machine Learning. The topic of the year is " Putting Artificial intelligence to work on Patterns". 
For the first time, ICPR has employed a two-round review process similar to journal submissions, with new papers allowed to be submitted in either the first or second round and papers submitted in the first round and not accepted allowed to be revised and re-submitted for second round review. 

In this edition of the **ICPR 2020** Conference, there are 1407 Oral/Poster presentations organized in five Tracks: 
- Artificial Intelligence, Machine Learning for Pattern Analysis; 
- Biometrics, Human Analysis and Behavior Understanding; Computer Vision, Robotics and Intelligent Systems; 
- Document and Media Analysis; and 
- Image and Signal Processing. 

The **ICPR 2020** Main Conference program also includes 7 Keynotes from prominent world-renowned scientists, 8 Tutorials, 28 Demos, 8 Challenges, 2 Panels, as well as an Industry/Sponsor Exhibition. In addition, 41 Workshops on a range of important current and emerging research topics complete the ICPR 2020 program. 


Ranga Raju Vatsavai

2

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Local Clustering with Mean Teacher for Semi-supervised learning

Local Clustering with Mean Teacher for Semi-supervised learning